= Baokun Liang
{c}
An electron-microscopy researcher whose team tested how beam energy affects images of thin <polymer> films. The highest accelerating voltage did not give the clearest structure: the experiment balanced image information against <electron beam damage>. Among the tested conditions, 120 kV produced the best reported resolution for the studied specimens, illustrating why an optimal setting must be established for the material being imaged.<Optimal acceleration voltage for near-atomic resolution imaging of layer-stacked 2D polymer thin films by Baokun Liang and others>[Abstract and experimental comparison of 80, 120, 200 and 300 kV]{ref}
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