= Current continuity between a metal and an intrinsic semiconductor
{title2=$en_mA_mv_m=en_iA_g(|v_e|+|v_h|)$}
In a steady <series circuit>, both <electron> and hole <conventional currents> contribute in the intrinsic <semiconductor>, while one <electron> population carries the metal current. Taking magnitudes along the current direction gives the displayed relation, with $n=p=n_i$ in the intrinsic region. The large metal <carrier density> can yield a much smaller drift speed despite its smaller cross-section. Interface conversion between <electron> and hole transport does not violate total current continuity.
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