= Eamon Nash
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<Eamon Nash> is an applications engineer whose technical writing connects amplifier models with measurements of real circuits. His <A Practical Review of Common Mode and Instrumentation Amplifiers by Eamon Nash> explains how finite <common-mode rejection ratio> converts a shared input disturbance into output error, even when the desired signal is differential.<A Practical Review of Common Mode and Instrumentation Amplifiers by Eamon Nash>[Equations (1)–(2) and discussion of frequency-dependent rejection]{ref}
His later RF-modeling article compares simulated and measured amplifier behavior. Small-signal scattering parameters describe linear gain and matching, but additional data are needed for noise and nonlinear compression. One demonstrated limitation is especially instructive: a model can reproduce amplitude compression while missing signal-dependent phase distortion because its input data contain only small-signal phase. That makes the disagreement scientifically useful evidence about what information the model lacks.https://www.analog.com/en/resources/analog-dialogue/articles/nonlinear-simulation-of-rf-ic-amplifiers-in-keysight-genesys-and-systemvue.html[Author byline and AM-to-AM and AM-to-PM Distortion section]{ref}
\Image[https://www.analog.com/en/_/media/images/analog-dialogue/en/authors/eamon-nash.jpg]
{title=Eamon Nash, portrait identified by the linked author, institutional or Commons source}
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