Heinrich Kirchauer (source code)

= Heinrich Kirchauer
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<Heinrich Kirchauer> authored a dissertation treatment of <photolithography> that explains <photoresist contrast> through the exposure-response curve. The account relates <photoresist> thickness after development to exposure dose, separating the onset of clearing from complete removal. This makes contrast a measurable process characteristic rather than simply visual darkness.<Contrast and Important Properties by Heinrich Kirchauer>[§2.6.1]{ref}