Measurement of point-spread function (PSF) for confocal fluorescence microscopy by InCheon Song and others Created 2026-10-13 Updated 2026-11-05
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Published in Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II.
Publisher: SPIE, Bellingham, WA.
Published in Proceedings of SPIE, volume 5878, article 58781B (proceedings series, not treated as the parent title).
Cited passages: §2 and Fig. 1, pp. 2–3: apparatus; §3.2 and Figs. 4–5, pp. 4–5: bead-size comparison and limitations.
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