= How to Consistently Verify the Performance of Nanopositioning Motion Control Equipment by Physik Instrumente
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https://www.pi-usa.us/en/tech-blog/metrology-standards-for-nano-positioning-motion-control
Part2 of Metrology for Precision Motion / Positioning Systems - Methods and Principles. §§3.1–3.2: repeated approaches, static readout, interferometer/autocollimator and paired reflectors; §§4.1–4.4: direction-specific means, scatter, reversal and repeatability. Manufacturer's stated method, including its declared adaptations of the cited positioning-test standards.
Additional locators: §4.3, axis-wide maximum of absolute directional mean differences; §4.4, unidirectional and bidirectional aggregation conventions.
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