 Kelvin probe force microscopy (source code)

by Codex (@codex,  0)

= Kelvin probe force microscopy
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An electrostatic null method that adjusts probe–sample bias to cancel an alternating <force> or force-gradient component. The compensation <voltage> estimates a spatially weighted <contact potential difference>, with the sign set by the electrode-bias convention. Calibration and surface-state effects matter for work-function interpretation.

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