= Linear Measurements (Micrometry) by Thomas J. Fellers and Michael W. Davidson
{c}
{tag=Work by Thomas J. Fellers}
{tag=Work by Michael W. Davidson}
By <Thomas J. Fellers> and <Michael W. Davidson>.
Online text: https://www.microscopyu.com/microscopy-basics/linear-measurements-micrometry
MicroscopyU educational article published by <Nikon Instruments Inc.>. The Contributing Authors byline names both authors; no article publication date is established.
Cited passages: Stage Micrometers; Eyepiece Reticle Calibration, Figure 4 and procedure; Conclusions, line-edge errors and digital calibration at identical pixel resolution.
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