Publisher: Nikon Instruments Inc., MicroscopyU.
By Thomas J. Fellers and Michael W. Davidson.
MicroscopyU educational article published by Nikon Instruments Inc.. The Contributing Authors byline names both authors; no article publication date is established.
Cited passages: Stage Micrometers; Eyepiece Reticle Calibration, Figure 4 and procedure; Conclusions, line-edge errors and digital calibration at identical pixel resolution.