= Solution
In <transmission electron microscopy>, the <electron objective lens> forms an intermediate real-space image and intermediate/projector lenses enlarge it onto a screen or camera. The total optical <magnification> is the product of the relevant stage magnifications. The user changes imaging-lens excitations to select <magnification>, while separately controlling illumination and focus. Display resizing introduces an additional enlargement, so the recorded pixel calibration matters.
In <scanning transmission electron microscopy>, a focused probe is rastered across the specimen and a detector signal is assigned to each probe position. The displayed <magnification> is display width divided by scanned specimen width. The user increases <magnification> by reducing raster-deflection amplitude, independently of choosing a smaller incident probe with the probe-forming lenses. \b[TEM changes image-forming lens magnification; STEM changes the raster field of view.] A smaller field or more pixels does not create finer physical resolution than the probe, specimen scattering and detection permit. A calibrated real-space scale is more transferable than the apparent size on a monitor.<Scanning Electron Microscope A To Z by JEOL>[printed p.7, raster-width/display-width magnification; this geometric relation also applies to scanned transmitted-electron imaging]{ref}
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