= Solution
\b[<LiftMode> is a two-pass measurement separating a measured topographic path from a longer-range interaction measurement.] The first pass records height with ordinary topographic feedback. On the second pass the tip retraces that line at a chosen vertical offset above it, reducing contact and short-range contributions while detecting electrostatic or magnetic interactions.
The lift height is relative to the recorded path, not a single constant laboratory height over a corrugated sample. Its usefulness depends on first-pass accuracy and whether the relevant long-range signal remains detectable at that separation.<Scanning Probe Microscopy Modes by Bruker>[LiftMode two-pass description and retracing the stored topography with a height offset]{ref}
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