= Solution
\b[A steady-current image is not supported by the electrical connection drawn.] <tunnelling atomic force microscopy> requires a conducting <AFM probe>, an applied <bias voltage> and a continuous return path from the contacted region to the current amplifier. <graphene> is conducting, but a flake on insulating <glass> is not electrically grounded merely because the other side or edge of the <glass> is earthed. Charging transients or displacement current are not its steady conductivity. Add a metal contact actually touching the <graphene> before using its current contrast; ordinary force-based <surface topography> can still be recorded without that contact. The manufacturer's nanostructure measurements explicitly distinguish objects connected to conducting pads from unconnected particles on the same insulating substrate.<Simultaneous Electrical and Mechanical Property Mapping at the Nanoscale with PeakForce TUNA by Bruker>[application note 132, Figure 11 and accompanying discussion of electrical connection]{ref}
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