= Solution
\b[<quantitative nanomechanical mapping> can image the flake without an electrical return path.] Repeated <AFM force curves> provide <surface topography>, <adhesion> and deformation or effective <elastic modulus> channels. The step and differences in tip–surface interaction can distinguish <graphene> from <glass>. For an atomically thin supported sheet the contact response is strongly substrate dependent, so fitting a three-dimensional half-space contact model does not directly measure the intrinsic in-plane <Young's modulus> of free <graphene>. Calibrate the <cantilever spring constant>, deflection sensitivity and tip radius, use small loads, and compare bare substrate. The manufacturer's description specifies the force-curve origin of the mechanical channels.<Simultaneous Electrical and Mechanical Property Mapping at the Nanoscale with PeakForce TUNA by Bruker>[application note 132, Quantitative Mechanical Property Mapping]{ref}
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