= Solution
\b[Use <high-resolution transmission electron microscopy> with a coherent, well-aligned beam and an objective aperture admitting the direct beam and the spatial frequencies required at the interface.] Orient a crystalline region near a suitable <zone axis> so that useful lattice fringes are excited; minimize drift, vibration and astigmatism. Choose defocus and aberration correction to transfer the target frequencies, rather than treating the image as a direct map of atoms at arbitrary defocus.
An aberration-corrected <scanning transmission electron microscopy> probe with <high-angle annular dark-field imaging> can instead resolve an interface with more directly interpretable atomic-number contrast. A nominal $150\,\mathrm{nm}$ thickness may be too great for clean atomic-resolution interpretation: thin the interface further if necessary, finish <focused ion beam milling> at lower ion energy to reduce damaged surface layers, and check for curtaining and implantation. The best mode depends on crystallinity and damage sensitivity; an amorphous interface calls for resolving its boundary and composition rather than inventing lattice fringes.
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