= Resistivity and Hall Measurements by National Institute of Standards and Technology
{c}
{tag=Work by National Institute of Standards and Technology}
By <National Institute of Standards and Technology>.
Official text: https://www.nist.gov/pml/nanoscale-device-characterization-division/popular-links/hall-effect/resistivity-and-hall
Institutional measurement procedures covering contact geometry, reversal of <electric current> and <magnetic field>, and extraction of sheet <carrier density> and <Hall mobility>. Bulk density requires the conducting thickness.
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