= Ronald G. Dixson
{c}
{tag=Physicist}
A researcher in nanoscale <metrology> who coauthored studies of width measurements with <atomic force microscopy>. A shaped probe senses steep sidewalls, but its lateral motion changes the effective width that must be subtracted from a measurement. The work examined calibration under matched conditions, showing why a microscope's control method is part of the measurement model.<Effects of Lateral Tip Control in CD-AFM Width Metrology by Ronald G. Dixson and others>[NIST abstract: flared tips, lateral dither, effective width and calibration conditions]{ref}
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