= Scanning transmission electron microscopy
<Scanning transmission electron microscopy> forms an image by scanning a focused <electron> probe across a thin specimen and recording transmitted or scattered <electrons> at each probe position. The detector's angular range determines which interaction contributes to the recorded brightness.
A detector including the direct beam gives a different <image contrast> mechanism from an annular detector collecting scattered <electrons>. <High-angle annular dark-field imaging> can emphasize composition and mass-thickness differences, but specimen thickness and channeling still affect interpretation. The probe size limits spatial detail, whereas the displayed-to-scanned length ratio sets <magnification>; increasing the latter cannot sharpen the probe.
Back to article page
