= Single-electron interference pattern buildup
A sequence of individual localized <electron> detections can accumulate a two-path <interference> distribution when the apparatus maintains coherence. The 1989 experiment led by <Akira Tonomura> used a field-emission source, an <electron> biprism, <electron> lenses and a position-sensitive <electron> counter. It realized two coherent paths without literal machined double slits. Low occupation of the instrument excludes interactions between different <electrons> as the origin of the fringes.<Demonstration of single-electron buildup of an interference pattern by Akira Tonomura and others>[section III and conclusion]{ref}
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