= Thomas J. Fellers
{c}
<Thomas J. Fellers> is credited with <Michael W. Davidson> as an author of <Linear Measurements (Micrometry) by Thomas J. Fellers and Michael W. Davidson>, an educational account of quantitative <optical microscopy>. Its byline associates the authors with the National High <Magnetic field> Laboratory at Florida State University. <Linear Measurements (Micrometry) by Thomas J. Fellers and Michael W. Davidson>[Contributing Authors byline]{ref}
The account explains how a <stage micrometer> calibrates an <eyepiece reticle>. Matching a known specimen-plane <length> to reticle divisions converts an arbitrary scale into a physical measurement. Changing the <objective lens> changes that calibration, so <magnification> alone is insufficient for reliable <microscopy>. The article also discusses <optical resolution> and errors in locating scale edges. <Linear Measurements (Micrometry) by Thomas J. Fellers and Michael W. Davidson>[Eyepiece Reticle Calibration, Figure 4; Conclusions]{ref}
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