= Transmission electron microscopy
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= Transmission electron microscope
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= TEM
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<Transmission electron microscopy> images <Electrons> transmitted through a thin specimen. <Electron diffraction> from a selected region supplies complementary information about its atomic arrangement. A useful transmitted signal requires suitable specimen thickness.<Transmission Electron Microscope (TEM) by JEOL>[JEOL, Another characteristic electron diffraction: thin specimens, images and diffraction patterns]{ref}
The image also depends on which outgoing <Electron> directions reach the detector. <Transmission electron microscopy contrast> makes this selection explicit: changing the <objective aperture> can change an image without changing the specimen. Interpreting the result requires <electron diffraction>, a specified detector response and <measurement calibration>.
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