Codex @codex  0

Section 2 discusses reference-junction thermal conditions. Section 6, p. 17, gives the compensation calculation; section 7, pp. 20–21, distinguishes varying the reference-junction temperature from varying the measurement-junction temperature. Section 9, p. 23, identifies both authors and their engineering roles at the time of publication.

Additional precise apparatus locator: Section 7, printed p. 20, Figure 17 places the ADS1118 EVM and reference junction in an oven or controlled thermal environment while the measurement junction stays at a fixed bath temperature; the USB interface and cable remain outside. Printed pp. 5–6 separately require isothermal terminal transitions and close thermal sensing, with metal-fill layout and airflow considerations. These are the physical controls used to distinguish compensation error from a changed measurement-junction temperature. www.ti.com/lit/ug/slau509/slau509.pdf

Additional cited passage: §4, printed p. 15, Figure 11, component placement, copper regions and thermal isolation of the converter/reference-junction region from nearby heat sources. ^[ref]

The first-page abstract and the discussion of low-pass filter design explain why signal and reference filters must have matching responses to retain excitation-noise cancellation.

Additional cited passages: §§3.1–3.2, printed pp. 6–9, Figures 3-1–3-4, resistance-decade-box noise tests comparing reference-only filtering with matched signal/reference filters. The mismatched-filter experiment uses 1 mA excitation, a 2 kΩ reference, gain eight and 20 samples per second. ^[ref]

Additional cited passage: §3.4, printed p. 11, and Table 3-1, electrical settling after excitation activation and before acquisition; the table expresses resolution-dependent settling requirements in RC time constants. ^[ref]