= Electromigration
{wiki=Electromigration}
Electromigration is a physical phenomenon that occurs in conductive materials, particularly in metals used in microelectronic devices. It refers to the transport of metal atoms within a conductor due to the movement of electrical current. When a high current density passes through a metal interconnect (such as copper or aluminum), it can cause metal ions to migrate from areas of high density to areas of low density, leading to voids (or gaps) in the material.
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