Grazing incidence diffraction (source code)

= Grazing incidence diffraction
{wiki=Grazing_incidence_diffraction}

Grazing incidence diffraction (GID) is a specialized diffraction technique used primarily in the study of thin films, surfaces, and layered materials. It involves directing a beam of X-rays, neutrons, or other incident particles at a very shallow angle (the grazing angle) with respect to the surface of a sample. This technique is particularly valuable for investigating the structural properties of materials at or near their surfaces.