Source: wikibot/hot-carrier-injection
= Hot-carrier injection
{wiki=Hot-carrier_injection}
Hot-carrier injection (HCI) is a phenomenon that occurs in semiconductor devices, primarily in metal-oxide-semiconductor field-effect transistors (MOSFETs). It involves the injection of high-energy "hot" carriers—typically electrons or holes—into the gate oxide of a MOSFET or other regions of the semiconductor device. This typically happens when the device is operating at high voltages and/or high temperatures.