= John Woollam (physicist)
{wiki=John_Woollam_(physicist)}
John Woollam is an American physicist known for his contributions to the field of optical thin film characterization and materials science. He is particularly recognized for his work on ellipsometry, a technique used to measure the change in polarization as light reflects or transmits through materials. Woollam has been instrumental in developing instruments and methodologies for accurate material characterization, which have applications in various industries, including semiconductors, optics, and nanotechnology.
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