= Photo-reflectance
{wiki=Photo-reflectance}
Photo-reflectance (PR) is a technique used in materials science and semiconductor research to probe the optical properties of materials, particularly thin films and semiconductor layers. It involves measuring the reflectance of light from a sample as a function of wavelength or energy, while the sample is illuminated with modulated light. This technique is particularly sensitive to changes in the electronic structure of the material.
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