Reflectometric interference spectroscopy
= Reflectometric interference spectroscopy
{wiki=Reflectometric_interference_spectroscopy}
Reflectometric Interference Spectroscopy (RIfS) is an optical technique used for measuring thin films and surfaces, particularly in the fields of materials science, photonics, and biology. The method is based on the interference of light waves reflected from different layers of a sample, which can include thin films, coatings, or biological materials.