Scanning helium microscopy
= Scanning helium microscopy
{wiki=Scanning_helium_microscopy}
Scanning helium microscopy (SHeM) is a form of microscopy that employs a beam of helium atoms to image surfaces at the nanoscale. This technique is noted for its unique ability to achieve high-resolution images with minimal sample damage, making it particularly advantageous for delicate materials and biological specimens. In SHeM, a fine beam of low-energy helium atoms is scanned across the sample surface.