Vibrational analysis with scanning probe microscopy
= Vibrational analysis with scanning probe microscopy
{wiki=Vibrational_analysis_with_scanning_probe_microscopy}
Vibrational analysis with scanning probe microscopy (SPM) refers to a set of techniques that combine the capabilities of scanning probe microscopy (such as atomic force microscopy, or AFM, and scanning tunneling microscopy, or STM) with vibrational spectroscopy techniques to study the vibrational modes and properties of materials at the nanoscale.