The Jamin interferometer is an optical device used to measure the refractive index of materials and to perform precision measurements in various fields such as optics and metrology. It is named after the French physicist Émile Jamin, who developed this interferometric technique. The basic configuration of a Jamin interferometer consists of two beam splitters and two mirrors, arranged in such a way that two beams of light are generated from a single coherent light source.
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