Electrically detected magnetic resonance

Electrically detected magnetic resonance (EDMR) is a sensitive technique used to study charge-related properties of semiconductor materials, particularly in the context of defects, impurities, and electronic states. It is a variant of traditional electron paramagnetic resonance (EPR) or electron spin resonance (ESR). In EDMR, the magnetic resonance of paramagnetic defects or electron spins is detected through their effect on the electrical properties of a semiconductor sample.