An electron-microscopy researcher whose team tested how beam energy affects images of thin polymer films. The highest accelerating voltage did not give the clearest structure: the experiment balanced image information against electron beam damage. Among the tested conditions, 120 kV produced the best reported resolution for the studied specimens, illustrating why an optimal setting must be established for the material being imaged.[ref]
Optimal acceleration voltage for near-atomic resolution imaging of layer-stacked 2D polymer thin films by Baokun Liang and others. Abstract and experimental comparison of 80, 120, 200 and 300 kV
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