Eamon Nash is an applications engineer whose technical writing connects amplifier models with measurements of real circuits. His A Practical Review of Common Mode and Instrumentation Amplifiers by Eamon Nash explains how finite common-mode rejection ratio converts a shared input disturbance into output error, even when the desired signal is differential.[ref]
A Practical Review of Common Mode and Instrumentation Amplifiers by Eamon Nash. Equations (1)–(2) and discussion of frequency-dependent rejection
His later RF-modeling article compares simulated and measured amplifier behavior. Small-signal scattering parameters describe linear gain and matching, but additional data are needed for noise and nonlinear compression. One demonstrated limitation is especially instructive: a model can reproduce amplitude compression while missing signal-dependent phase distortion because its input data contain only small-signal phase. That makes the disagreement scientifically useful evidence about what information the model lacks.[ref]
https://www.analog.com/en/resources/analog-dialogue/articles/nonlinear-simulation-of-rf-ic-amplifiers-in-keysight-genesys-and-systemvue.html. Author byline and AM-to-AM and AM-to-PM Distortion section
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