 Linear Measurements (Micrometry) by Thomas J. Fellers and Michael W. Davidson

By Thomas J. Fellers and Michael W. Davidson.

Online text: www.microscopyu.com/microscopy-basics/linear-measurements-micrometry

MicroscopyU educational article published by Nikon Instruments Inc.. The Contributing Authors byline names both authors; no article publication date is established.

Cited passages: Stage Micrometers; Eyepiece Reticle Calibration, Figure 4 and procedure; Conclusions, line-edge errors and digital calibration at identical pixel resolution.