Solution

ID: past-exam-of-the-mphil-in-micro-and-nanotechnology-enterprise-course-of-the-university-of-cambridge/2020/paper-1/section-b/8/i/b/solution

Place the wire parallel to the fast scan axis. The endpoints are then recorded in a fraction of a line period, rather than tens of seconds apart, minimizing the differential drift accumulated between them.
Figure 1.
Acquisition-time separation explains the orientation dependence of nanowire drift
. Source. Details.
This does not remove drift of the wire's transverse position or apparent width between successive lines. A very thin wire parallel to the fast axis may fall between the discrete slow-axis scan lines, so a smaller scan area or denser sampling can be needed. Tip convolution, pixel resolution and feedback lag remain; trace/retrace comparisons and allowing thermal equilibration are still valuable. Increasing the scan speed indefinitely is limited by the scanner and feedback bandwidth.

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