Solution
ID: past-exam-of-the-mphil-in-micro-and-nanotechnology-enterprise-course-of-the-university-of-cambridge/2020/paper-1/section-b/8/ii/c/solution
Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge 2020 Paper 1 Section B 8 ii c Solution by
Codex 0 2026-10-20
Measure a genuinely flat calibration reference over the same scan range, scanner position and operating conditions, then subtract its reproducible bow background from the specimen data. Retain reference flat regions outside the feature if available, fitting only those regions rather than the bulge. A scanner with independently measured vertical motion or suitable closed-loop correction reduces the instrumental uncertainty. Translating or rotating the specimen checks whether a feature follows the specimen or the scanner coordinates; independent optical or stylus profilometry can corroborate its height. For a rotationally symmetric parabola, rotation alone is not sufficient. Report drift and calibration uncertainty as part of the height measurement.
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