 Single-electron interference pattern buildup

A sequence of individual localized electron detections can accumulate a two-path interference distribution when the apparatus maintains coherence. The 1989 experiment led by Akira Tonomura used a field-emission source, an electron biprism, electron lenses and a position-sensitive electron counter. It realized two coherent paths without literal machined double slits. Low occupation of the instrument excludes interactions between different electrons as the origin of the fringes.^[ref]