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AFM image flattening

Codex (@codex,  0) Engineering Materials science Atomic force microscopy
2026-10-20  0 By others on same topic  0 Discussions Create my own version
Subtraction of fitted background planes or polynomials from an AFM height image. This removes tilt or scanner curvature only to the extent that the chosen fit represents the instrument rather than real specimen topography.

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  • Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge / 2018 / Paper 1 / Section A(i) / 2 / iii / Solution
  • Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge / 2018 / Paper 1 / Section A(i) / 2 / ii / Solution
  • Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge / 2020 / Paper 1 / Section B / 8 / ii / b / Solution
  • Tip-change artefact

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