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Double-tip artefact
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Engineering
Materials science
Atomic force microscopy
AFM tip-convolution artefact
2026-10-20
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Duplicated or distorted
surface
features arising when more than one effective apex contributes to the measured envelope. Attachment or loss of
a
particle can change the
image
abruptly without changing the sample.
Ancestors
(5)
AFM tip-convolution artefact
Atomic force microscopy
Materials science
Engineering
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Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge
/
2018
/
Paper 1
/
Section A(i)
/
2
/
i
/
Solution
Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge
/
2018
/
Paper 1
/
Section A(i)
/
2
/
iv
/
Solution
Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge
/
2023
/
Paper 1
/
Section A(i)
/
2
/
iii
/
Solution
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