= Electron backscatter diffraction
<Electron backscatter diffraction> determines crystallographic information from <electron diffraction> patterns recorded in a <scanning electron microscope>. A scanned electron beam strikes a crystalline specimen, and the detector records backscattered-electron diffraction patterns. Their band geometry can be indexed against a crystal model to estimate local orientation and identify compatible phases.<What is Electron Backscatter Diffraction? by Oxford Instruments>[Instrument developer’s EBSD principles and microstructure mapping]{ref}
Repeating the measurement across a surface produces an orientation map that can reveal <crystal grains>, boundaries and changes associated with deformation or <recrystallisation>. Preparation and pattern quality matter: a map records successfully indexed information, so poor surface quality or an unsuitable structural model can create missing or misleading assignments. It complements chemical analysis rather than directly reporting elemental composition.
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