Electron microscopy
= Electron microscopy
<Electron microscopy> is the practice of preparing specimens, producing images with an <electron microscope>, and interpreting their contrast. A dark region can reflect <electron> deflection out of the admitted beam rather than complete absorption. A useful image therefore needs a stated preparation, detection signal and length calibration; brightness by itself does not identify a material. <Transmission electron microscopy> probes thin specimens, whereas a <scanning electron microscope> can examine the exposed surface of a bulk specimen.<Scanning Electron Microscopes (SEM) by JEOL>[JEOL, Observation of the micro world using electrons and Various Function of SEM: transmitted versus surface-generated signals]{ref}