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Engineering
Materials science
Atomic force microscopy
2026-10-20
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A
two-pass scan method recording
topography
first
, then retracing it at an offset
height
to
measure
a
longer-range interaction with reduced
contact
contributions. It is
a
Bruker
mode
name
.
[ref]
Scanning Probe Microscopy Modes by Bruker
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Atomic force microscopy
Materials science
Engineering
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Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge
/
2018
/
Paper 1
/
Section B
/
7
/
vi
/
a
/
Solution
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