= Microscopy
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<Microscopy> makes small structures observable by using an <optical microscope>, an <electron microscope>, or a scanned probe such as an <atomic force microscope>. Each instrument measures a different interaction with the specimen: transmitted <light>, scattered <electrons>, or the <force> on a tip. Consequently two images of the same object need not show the same features.
A useful measurement distinguishes <magnification>, <optical resolution> and <image contrast>. Enlarging a blurred image changes its displayed size without recovering the missing detail. For an <optical microscope>, imaging small separated objects and recording how their images merge tests <optical resolution>; changing the illumination while holding the specimen fixed tests whether a feature comes from specimen structure or the imaging method.
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