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By Thomas J. Fellers and Michael W. Davidson.

Online text: www.microscopyu.com/microscopy-basics/linear-measurements-micrometry

MicroscopyU educational article published by Nikon Instruments Inc.. The Contributing Authors byline names both authors; no article publication date is established.

Cited passages: Stage Micrometers; Eyepiece Reticle Calibration, Figure 4 and procedure; Conclusions, line-edge errors and digital calibration at identical pixel resolution.

Thomas J. Fellers is credited with Michael W. Davidson as an author of Linear Measurements (Micrometry) by Thomas J. Fellers and Michael W. Davidson, an educational account of quantitative optical microscopy. Its byline associates the authors with the National High Magnetic field Laboratory at Florida State University. ^[ref]

The account explains how a stage micrometer calibrates an eyepiece reticle. Matching a known specimen-plane length to reticle divisions converts an arbitrary scale into a physical measurement. Changing the objective lens changes that calibration, so magnification alone is insufficient for reliable microscopy. The article also discusses optical resolution and errors in locating scale edges. ^[ref]