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 Tagged: Work by Bruker

PeakForce QNM by Bruker Created 2026-10-20 Updated 2026-11-05

www.bruker.com/it/products-and-solutions/microscopes/materials-afm/afm-modes/peakforce-qnm.html

Official technique description: normal peak-force control, nanomechanical-property mapping and calibration.

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PeakForce QNM User Guide by Bruker Created 2026-10-20 Updated 2026-11-05

mmrc.caltech.edu/AFM%20Dimension%20Icon/Bruker%20Training/004-1036-000%20PEAKFORCE%20QNM%20USERS%20GUIDE-F.pdf

Revision F, June 2011. Sections 2.2 and 2.5, especially 2.5.1 DMT Modulus, 2.5.3 Adhesion and 2.5.5 Dissipation.

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Scanning Probe Microscopy Modes by Bruker Created 2026-10-20 Updated 2026-11-05

mmrc.caltech.edu/AFM%20Dimension%20Icon/Bruker%20Training/SPM_Modes.pdf

Manufacturer mode chart, hosted by Caltech's instrumentation facility. The inspected descriptions cover two-pass LiftMode and Surface Potential Imaging; these are instrument-principle descriptions, not independent measurements of the exam specimen.

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Simultaneous Electrical and Mechanical Property Mapping at the Nanoscale with PeakForce TUNA by Bruker Created 2026-10-20 Updated 2026-11-05

Application note 132.

www.bruker.com/en/products-and-solutions/microscopes/materials-afm/resource-library/an-132-simultaneous-electrical-and-mechanical-property-mapping-at-the-nanoscale-with-peakforce-tuna.html

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