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Cambridge institutional account with a transmission-electron micrograph supplied by Yanhui Zhang, showing paired dislocation loops after creep testing. It explains order restoration by two matrix dislocations. brearley.msm.cam.ac.uk/2002/Zhang.html

Yanhui Zhang supplied the transmission electron microscopy image reproduced in Nickel based superalloy: dislocation structure by H. K. D. H. Bhadeshia. It shows paired dislocation loops in a nickel-based superalloy after creep testing. The source credits the image explicitly; this establishes the contribution without inferring an unrelated same-name biography.^[ref]