Error-related negativity (ERN) is an event-related potential (ERP) component observed in electroencephalography (EEG) studies that reflects the brain's response to making errors. It typically occurs within 50 to 100 milliseconds after the individual realizes that an error has been made. The ERN is often measured at frontocentral electrode sites and is believed to originate from the anterior cingulate cortex (ACC), a region associated with error detection and cognitive control.
