 Haynes–Shockley experiment

The Haynes–Shockley experiment is a significant study in the field of semiconductor physics, specifically related to the properties of semiconductor materials, particularly in the context of their use in electronic devices. The experiment was conducted by physicists Richard Haynes and William Shockley in the 1950s. The core of the experiment focused on understanding the behavior of carriers (electrons and holes) in semiconductors, especially how they recombine.