International Conference on Defects in Semiconductors
ID: international-conference-on-defects-in-semiconductors
The International Conference on Defects in Semiconductors (ICDS) is a scientific conference that focuses on the study of defects in semiconductor materials and their implications for electronic and optoelectronic devices. This conference serves as a platform for researchers, scientists, and industry professionals to present their latest findings, exchange ideas, and discuss developments related to defects in semiconductors, which are critical to the performance, reliability, and functionality of semiconductor devices.
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