Neutron depth profiling
ID: neutron-depth-profiling
Neutron depth profiling (NDP) is a specialized analytical technique used primarily in materials science and semiconductor research to investigate the depth distribution of certain elements within solid materials. The technique leverages the unique properties of neutrons, namely their ability to penetrate materials without causing significant damage, to analyze the composition and concentration of light elements (such as hydrogen, lithium, and boron) in thin films and other complex structures.
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